Design of a universal test platform for radiation testing of digital components
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Authors
Amsler, Duane E.
Subjects
Advisors
Fouts, Douglas J.
Date of Issue
1996-09
Date
September, 1996
Publisher
Monterey, California. Naval Postgraduate School
Language
en_US
Abstract
In this research, programmable, microcontroller-based test hardware was designed, constructed, debugged, and programmed. The wire-wrapped board will be used to test two custom static random access memory (SRAM) chips, as well as other custom chips designed at the Naval Postgraduate School. Components for the test hardware were selected to allow prototyping with standard parts that can later be replaced with radiation hardened parts as budgets permit. Control of the test hardware is via a RS-232 serial interface, which allows remote control programming and monitoring of the test hardware and device being tested.
Type
Thesis
Description
Series/Report No
Department
Organization
Identifiers
NPS Report Number
Sponsors
Funder
Format
xii, 81 p.
Citation
Distribution Statement
Approved for public release; distribution is unlimited.