Comparisons between radiation hardened and standard integrated circuit amplifiers in an electron beam.
Loading...
Authors
Lesemann, Donald Frederick
Subjects
radiation damage
integrated circuit operational amplifier
dielectric isolation
linear accelerator
integrated circuit operational amplifier
dielectric isolation
linear accelerator
Advisors
Chan, Shu-Gar
Dyer, John N.
Date of Issue
1969
Date
April 1969
Publisher
Monterey, California. U.S. Naval Postgraduate School
Language
en_US
Abstract
An investigation into the effect of radiation from a linear accelerator
on two types of integrated circuit operational amplifiers
was made. Dielectric isolation, thin film resistors and compensation
diodes were used in one amplifier (μA744) . The other amplifier
(μA709) was fabricated using standard methods.
The μA744 amplifier, in its current stage of development, was
found to be more susceptible to the effects of accumulated dose from
high energy electrons than the μA709 amplifier.
Type
Thesis
Description
Series/Report No
Department
Electrical Engineering
Organization
Naval Postgraduate School (U.S.)
Identifiers
NPS Report Number
Sponsors
Funder
Format
Citation
Distribution Statement
Approved for public release; distribution is unlimited.
Rights
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.