A survival analysis of the tanks and voids on USS John F. Kennedy (CV 67) and USS Enterprise (CVN 65)
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Authors
Cordon, Charles R.
Subjects
Reliability
Survival analysis
Aircraft carriers
Tanks
Voids
Survival analysis
Aircraft carriers
Tanks
Voids
Advisors
Whitaker, Lyn R.
Date of Issue
1997-03
Date
March 1997
Publisher
Monterey, California. Naval Postgraduate School
Language
eng
Abstract
The maintenance of an aircraft carrier's tanks and voids has a direct impact on ship operability and service life. The scheduling of inspections and repair work for these tanks and voids poses a significant problem for the carrier maintenance community. This thesis contributes to refining strategy in the repair planning process by providing the framework for building comprehensive tank and void database files. To demonstrate this, repair history files are constructed for USS John F. Kennedy (CV 67) and USS Enterprise (CVN 65). These files consolidate tank and void repair documentation from the myriad of carrier maintenance agencies and comprise the most complete database for these ships. A simliar database can be developed for all the carriers by duplicating this effort. A life cycle analysis of the data reveals that paint coating failure rates are more srmilar among tanks and voids on the same ship rather than among tanks of the same flinctional type. A case study for CV-67 examines model accuracy and predicts the expected number of coating failures at a filture maintenance period. The lessons learned in this thesis directly supports a follow on study of the JP-5 tanks on the Nimitz class aircraft carriers.
Type
Thesis
Description
Series/Report No
Department
Department of Operations Research
Organization
Naval Postgraduate School
Identifiers
NPS Report Number
Sponsors
Funder
Format
Citation
Distribution Statement
Approved for public release; distribution is unlimited.
Rights
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.