A picosecond-response photoconductive-sampling probe for digital circuit testing
Loading...
Authors
David, G.
Whitaker, J.F.
Ledbetter, E.J.
Weatherford, T.R.
Fouts, D.
Goyette, W.
Jobe, K.
Elliott, K.
Subjects
Advisors
Date of Issue
1997
Date
Publisher
IEEE
Language
Abstract
Recent efforts in noninvasive high-frequency and high-resolution measurement techniques have led to the development of a number of photoconductive probes [l-41]. In this paper the feasibility of using the fiber-coupled, micromachined probe described in [2,3] for in-circuit testing and characterization is demonstrated by detecting waveforms at internal nodes of two different digital circuits, On the one hand, measurements have been carried out which reveal the performance of a circuit under standard operating conditions. In this case the measured electrical signals originate from an external source, i.e., an rf synthesizer. In a second application, femtosecond optical pulses have illuminated one of the transistors of a circuit to generate the signal that is measured. This second approach is used to emulate so-called single-event upsets (SEU), which are usually caused by cosmic particles in satellite-based electronic systems. These effects have a
negative impact on the performance and reliability of these systems and therefore are a limiting factor for their commercial implementation. In the past, optical techniques to generate SEU effects have been successfully demonstrated for testing single devices [5]. In contrast, the results presented here demonstrate the generation and detection of these effects inside a complex circuit environment. Thus, they may especially benefit the development of radiation-immune circuits.
Type
Conference Paper
Description
The article of record as published may be found at http://dx.doi.org/10.1109/LEOS.1997.645385
Lasers and Electro-Optics Society Annual Meeting, 1997. LEOS '97 10th Annual Meeting. Conference Proceedings., IEEE (Volume: 2) Date of Conference: 10-13 Nov 1997 Page(s): 236 - 237 vol.2 Meeting Date : 10 Nov 1997-13 Nov 1997 Conference Location : San Francisco, CA
Lasers and Electro-Optics Society Annual Meeting, 1997. LEOS '97 10th Annual Meeting. Conference Proceedings., IEEE (Volume: 2) Date of Conference: 10-13 Nov 1997 Page(s): 236 - 237 vol.2 Meeting Date : 10 Nov 1997-13 Nov 1997 Conference Location : San Francisco, CA
Series/Report No
Department
Electrical and Computer Engineering
Organization
Naval Postgraduate School (U.S.)
Identifiers
NPS Report Number
Sponsors
Funder
Format
Citation
Distribution Statement
Rights
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.