DC-to-mm-wave-absolute potential measurements inside digital microwave ICs using a micromachined photoconductive sampling probe
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Authors
David, G.
Whitaker, J.F.
Weatherford, T.R.
Jobe, K.
Meyer, S.
Bustamante, M.
Goyette, W.
Thomas, S. III
Elliott, K.
Subjects
Advisors
Date of Issue
1998
Date
Publisher
Language
Abstract
A micromachined photoconductive sampling probe is used to determine detailed wave forms at different circuit nodes and corresponding propagation delays from within an InP HBT frequency divider operating at 2.7 GHz. The results demonstrate for the first time the capability of photoconductive probes for absolute-voltage, DC-coupled potential measurements in integrated circuits.
Type
Article
Description
Series/Report No
Department
Electrical and Computer Engineering
Organization
Naval Postgraduate School (U.S.)
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NPS Report Number
Sponsors
This work was sponsored by the National Science Foundation through the Center for Ultrafast Optical Science, AFOSR, Air Force Materiel Command, USAF and Alexander von Humboldt-Foundation, Germany
Funder
STC PHY 8920108, DOD-G-F49620-95-1-0027
Format
Citation
Distribution Statement
Rights
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.