DC-to-mm-wave-absolute potential measurements inside digital microwave ICs using a micromachined photoconductive sampling probe

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dc.contributor.authorDavid, G.
dc.contributor.authorWhitaker, J.F.
dc.contributor.authorWeatherford, T.R.
dc.contributor.authorJobe, K.
dc.contributor.authorMeyer, S.
dc.contributor.authorBustamante, M.
dc.contributor.authorGoyette, W.
dc.contributor.authorThomas, S. III
dc.contributor.authorElliott, K.
dc.contributor.corporateNaval Postgraduate School (U.S.)en_US
dc.contributor.departmentElectrical and Computer Engineeringen_US
dc.date.accessioned2016-05-24T21:58:27Z
dc.date.available2016-05-24T21:58:27Z
dc.date.issued1998
dc.description.abstractA micromachined photoconductive sampling probe is used to determine detailed wave forms at different circuit nodes and corresponding propagation delays from within an InP HBT frequency divider operating at 2.7 GHz. The results demonstrate for the first time the capability of photoconductive probes for absolute-voltage, DC-coupled potential measurements in integrated circuits.en_US
dc.description.funderSTC PHY 8920108, DOD-G-F49620-95-1-0027en_US
dc.description.sponsorshipThis work was sponsored by the National Science Foundation through the Center for Ultrafast Optical Science, AFOSR, Air Force Materiel Command, USAF and Alexander von Humboldt-Foundation, Germanyen_US
dc.identifier.urihttps://hdl.handle.net/10945/48701
dc.rightsThis publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.en_US
dc.titleDC-to-mm-wave-absolute potential measurements inside digital microwave ICs using a micromachined photoconductive sampling probeen_US
dc.typeArticleen_US
dspace.entity.typePublication
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