Publication:
Constant-Depth Scratch Test for the Quantification of Interfacial Shear Strength at Film-Substrate Interfaces

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Authors
Dutta, Indranath
Lascurain, David P.
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Date of Issue
1996-08-20
Date
Publisher
The United States of America as represented by the Secretary of the Navy, Washington, DC (US)
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Abstract
A Constant-Depth Scratch Test (CDST) technique to quantitatively determine the shear strength of interfaces between thin metallic or non-metallic films and metal or ceramic substrates is revealed. The test overcomes two problems associated with other types of scratch tests, namely the instrumental complexity required for real-time detection of interfacial failure, and the inability to quantify interfacial strength. These problems are circumvented by maintaining a constant depth during scratching through the coating and the substrate, monitoring the horizontal and vertical forces to sustain the constant depth scratch, and finally by using a model to analyze the test results to quantify the interfacial shear strength. Unlike other scratch tests, this test is capable of measuring interfacial shear strength as a function of position on the film-substrate sample.
Type
Patent
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Patent
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Monterey, California : Naval Postgraduate School
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This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.
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