Fault isolation using frequency response techniques.

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Authors
Martinache, Charles Gilbert
Subjects
fault isolation
circuit testing
fault identification
Advisors
Chan, Shu Gar
Date of Issue
1970-09
Date
September 1970
Publisher
Monterey, California ; Naval Postgraduate School
Language
en_US
Abstract
An investigation of using the response of a circuit at selected test frequencies to isolate faulty circuit components is made., fc procedure using a sensitivity approach for intelligent selection of test frequencies is developed. The developed procedure is tested and the results are compared with results using conventional procedures;.. The- effect of random, within tolerance variations of nonfaulty components: on the results is studied for both conventional and developed procedures.
Type
Thesis
Description
Series/Report No
Department
Electrical Engineering
Organization
Naval Postgraduate School (U.S.)
Identifiers
NPS Report Number
Sponsors
Funder
Format
Citation
Distribution Statement
Approved for public release; distribution is unlimited.
Rights
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.
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