Distribution of E2 strength in Si28 below 50 MeV excitation energy
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Authors
Pitthan, R.
Buskirk, F. R.
Dyer, N.
Hunter, E. E.
Pozinsky, G.
Subjects
Advisors
Date of Issue
1979-02
Date
Publisher
American Physical Society
Language
Abstract
Inelastic electron scattering in (28)Si between 4 and 50 MeV excitation energy reveals two concentrations of E2 strength in the continuum. One is between 15 and 20 MeV, with a peak at 17 MeV, and can be identified with the giant quadrupole resonance in the ground state oblate well. A broad distribution of E2 strength between 22 and 42 MeV is predominantly isovector in nature. In addition, a small but persistent E2 peak at 24 MeV was found, which may be interpreted as being the corresponding state in the prolate well to the 17 MeV resonance. It is shown that 50% or more of the photon cross section in excess of the classical dipole sum rule between 10 MeV and the pion threshold may be due to E2 absorption.
Type
Article
Description
Series/Report No
Department
Department of Physics and Chemistry
Organization
Naval Postgraduate School (U.S.)
Identifiers
NPS Report Number
Sponsors
Supported in part by the National Science Foundation and the Naval Postgraduate School Reearch Foundation
Funder
Format
11 p.
Citation
Physical Review C, v. 19, no. 2 February 1979, pp. 299-309
Distribution Statement
Approved for public release; distribution is unlimited.
Rights
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.