Soft error immune GaAs circuit technologies
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Authors
Weatherford, T.R.
Fouts, D.J.
Marshall, P.W.
Marshall, C.J.
Dietrich, H.
Subjects
Advisors
Date of Issue
1996-11
Date
Publisher
IEEE
Language
Abstract
Cosmic radiation induced soft errors present a major difficulty for space applications that utilize digital GaAs circuits and systems. Techniques to reduce soft error sensitivity by 5 orders of magnitude or more, to sufficient levels for safe implemen[ta]tion of GaAs ICs in space applications are presented. These results show that the need for redundancy and error correction is eliminated. Space systems will benefit by reduced power and area requirements, plus a substantial improvement in system performance over present radiation hardened silicon-based technologies.
Type
Article
Description
The article of record as published may be found at http://dx.doi.org/10.1109/GAAS.1996.567901
Series/Report No
Department
Electrical and Computer Engineering
Organization
Naval Postgraduate School (U.S.)
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NPS Report Number
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Citation
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Rights
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.