Radiation dose analysis of NPS flash X-ray facility using silicon PIN diode
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Authors
Jones, Bernard L.
Subjects
silicon radiation detectors
flash x-ray
dosimetry
thermoluminescent dosimeters
flash x-ray
dosimetry
thermoluminescent dosimeters
Advisors
Weatherford, Todd R.
Date of Issue
2003-09
Date
Publisher
Monterey, California. Naval Postgraduate School
Language
Abstract
Radiation output of the NPS Flash X-ray facility has been analyzed using commercial silicon PIN diodes. These results have been compared to dosimetry techniques using CaF2 TLDs (thermoluminescent dosimeters). The silicon PIN diodes were irradiated with photon energies of approximately 1 MeV and dose rates up to 1010 rad(Si)/s. These techniques and results can be used to provide real time calibration of the Flash X-ray facility.
Type
Thesis
Description
Series/Report No
Department
Electrical and Computer Engineering
Organization
Identifiers
NPS Report Number
Sponsors
Funder
Format
xvi, 41 p. : ill. (some col.) ;
Citation
Distribution Statement
Approved for public release; distribution is unlimited.
Rights
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.