Development of a pattern analysis technique for use in the selection of predictors.
Authors
Folce, Burton Frederick Jr.
Advisors
Weitzman, R.A.
Second Readers
Subjects
pattern analysis
SEQUIN
PAIN
SEQUIN
PAIN
Date of Issue
1973-06
Date
June 1973
Publisher
Monterey, California. Naval Postgraduate School
Language
en_US
Abstract
This study describes a computerized item-selection program called PAIN that uses a pattern-analysis approach to select a most-valid subset of items from a set. The results of this study indicate that PAIN is capable of selecting a small subset of items which, when scored by pattern analysis, has greater validity than the original set. It appears that, as well as reducing the sizes of standard tests without losing predictive value, PAIN may also be of value in selecting biographical items of information for use as predictors.
Type
Thesis
Description
Series/Report No
Department
Operations Research and Administrative Sciences
Organization
Naval Postgraduate School (U.S.)
Identifiers
NPS Report Number
Sponsors
Funding
Format
Citation
Distribution Statement
Approved for public release; distribution is unlimited.
Rights
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.