RADIATION-HARDENED MICROELECTRONICS WORKFORCE DEVELOPMENT GUIDELINE
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Authors
White, April C.
Subjects
radiation effects
microelectronics
guideline
training
radiation-hardened microelectronics
microelectronics
guideline
training
radiation-hardened microelectronics
Advisors
Sweeney, Joseph W., III
Gadlage, Matthew, NSWC Crane
Date of Issue
2023-09
Date
Publisher
Monterey, CA; Naval Postgraduate School
Language
Abstract
The United States government (USG) has observed that there is a technical readiness gap within one of its key technical capabilities (TC) in its nuclear defense: radiation-hardened (RH) microelectronics. The objective of the research is to develop a training plan/guideline for current and future workforce in the field of radiation-hardened microelectronics in order to provide them with the knowledge and skills needed to perform radiation effects testing, development, and analysis. This research utilized a qualitative research method conducted by one-on-one interviews with SMEs and electronic surveys aimed to answer the following questions: What is the ideal way to develop the current and future DOD workforce in the field of radiation-hardened microelectronics? How can we effectively develop the workforce to become subject matter experts (SMEs) in the field of radiation-hardened microelectronics? The responses from the workforce confirmed the gap within the field and the need for a robust training plan/guide for the current and future workforce. This thesis develops a training plan/guide that prescribes academic courses, software, and testing development for evolution and accession into SMEs within radiation-hardened microelectronics.
Type
Thesis
Description
Series/Report No
Department
Systems Engineering (SE)
Organization
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NPS Report Number
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Citation
Distribution Statement
Approved for public release. Distribution is unlimited.
Rights
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.