A comparison of redundant inverter topologies to improve voltage source inverter reliability
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Authors
Julian, Alexander L.
Oriti, Giovanna
Subjects
Mean time between failure (MTBF)
Redundancy
Reliability
Voltage-source inverter (VSI)
Redundancy
Reliability
Voltage-source inverter (VSI)
Advisors
Date of Issue
2007-09
Date
September/October 2007
Publisher
Language
Abstract
For applications sensitive to reliability, typical voltage-source inverters (VSIs) cannot always meet the reliability requirements. In these cases, some method of redundancy is used to improve system reliability. This paper compares the reliability of two redundant VSI circuit topologies to a typical VSI circuit. The redundant circuits function normally after the failure (open or short) of any single component, including the controller, current and voltage sensors, capacitors, insulated gate bipolar transistors, and power diodes. The parts count method of reliability comparison that is described in MIL-HDBK-217F is used to compare the reliability functions for the three circuit topologies.
Type
Article
Description
The article of record as published may be found at http://dx.doi.org/10.1109/TIA.2007.904436
Series/Report No
Department
Electrical and Computer Engineering (ECE)
Organization
Naval Postgraduate School (U.S.)
Identifiers
NPS Report Number
Sponsors
Funder
Format
Citation
A.L. Julian, G. Oriti, "A comparison of redundant inverter topologies to improve voltage source inverter reliability", IEEE Transactions on Industry Applications, Vol. 43, No.5, September/October 2007, pp. 1371-1378.
Distribution Statement
Rights
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.