Analysis of indeterminate structures by mechanical, electrical and optical means ...
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Authors
Laurenzano, Frank Michael
Padden, Thomas Joseph
Roy, Vershall Aaron
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Date of Issue
1948-09
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Rensselaer Polytechnic Institute
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Abstract
The object of this thesis is to investigate scale and micrometer methods of mechanical analysis; and more important, to develop electrical and optical means applicable to measuring minute deflections of models.
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Thesis
Description
This thesis document was issued under the authority of another institution, not NPS. At the time it was written, a copy was added to the NPS Library collection for reasons not now known. It has been included in the digital archive for its historical value to NPS. Not believed to be a CIVINS (Civilian Institutions) title.
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Rights
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.