Testing or Fault-finding for Reliability Growth: A Missile Destructive-test Example
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Authors
Gaver, D.P.
Jacobs, P.A.
Subjects
reliability growth; Bayesian sequential analysis; Poisson process; destructive
testing; how much testing is enough; operational testing
Advisors
Date of Issue
1997
Date
1997
Publisher
Language
Abstract
A new piece of equipment has been purchased in a lot of size m. Some of the
items can be used in destructive testing before the item is put into use. Testing uncovers
faults which can be removed from the remaining pieces of equipment in the lot. If t m
pieces of equipment are tested, then those that remain, mt m 0 t, have reduced fault
incidence and are more reliable than initially, but mt may be too small to be useful, or than
is desirable. In this paper models are studied to address this question: given the lot size m,
how to optimize by choice of t the effectiveness of the pieces of equipment remaining after
the test. The models used are simplistic and illustrative; they can be straightforwardly
improved
Type
Article
Description
Naval Research Logistics, 44, 1997, pp. 623-637.
Series/Report No
Department
Operations Research (OR)
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NPS Report Number
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Citation
Gaver, D.P. and Jacobs, P.A.Testing or Fault-finding for Reliability Growth: A Missile Destructive-test ExampleNaval Research Logistics, 44, 1997, pp. 623-637.
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defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.