Comparison of experimental and theoretical electronic charge distributions in [gamma]-TiAl
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Authors
Lu, Z.W.
Zunger, A.
Fox, A.G.
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Date of Issue
1994-12-01
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Abstract
Using critical voltage electron diffraction, Fox has recently determined the lowest seven X-ray structure factors of [gamma]-TiAl (L1[sub 0] structure). The authors present here a comparison of these accurately measured (0.15%) structure factors with first-principles local density calculations, finding an agreement within 0.7% and an r.m.s. error of 0.013 e/atom. While such measurements are limited to the first few structure factors [rho](G) (where G is the crystal momentum), theory is able to obtain [rho](G) for arbitrarily high G. If they construct charge density deformation maps by Fourier summations up to the lowest measured G, the calculated and experimental density deformation maps agree very closely. However, if they include in the theoretical density deformation map high G values (outside the range accessible to experiment), qualitatively different bonding patterns appear, in particular between Ti atoms. Systematic study of the total, valence, and deformation charge densities as well as comparison with result for NiAl in the hypothetical L1[sub 0] structure elucidate the bonding patterns in these transition metal aluminides.
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Article
Description
The article of record as published may be found at https://doi.org/10.1016/0956-7151(94)90171-6
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Naval Postgraduate School (U.S.)
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AC36-83CH10093
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Journal Name: Acta Metallurgica et Materialia; (United States); Journal Volume: 42:12
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This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.