Strong terahertz absorption using thin metamaterial structures

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Authors
Alves, Fabio
Kearney, Brian
Grbovic, Dragoslav
Lavrik, Nickolay V.
Karunasiri, Gamani
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Date of Issue
2012-01-01
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Language
en_US
Abstract
Metamaterial absorbers with nearly 100% absorption in the terahertz (THz) spectral band have been designed and fabricated using a periodic array of aluminum (Al) squares and an Al ground plane separated by a thin silicon dioxide (SiO{sub 2}) dielectric film. The entire structure is less than 1.6 mm thick making it suitable for the fabrication of microbolometers or bi-material sensors for THz imaging. Films with different dielectric layer thicknesses exhibited resonant absorption at 4.1, 4.2, and 4.5 THz with strengths of 98%, 95%, and 88%, respectively. The measured absorption spectra are in good agreement with simulations using finite element modeling.
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Article
Description
The article of record as published may be found at http://dx.doi.org/10.1063/1.3693407
URI
https://hdl.handle.net/10945/57267
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Sponsors
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Center for Nanophase Materials Sciences
USDOE Office of Science (SC)
Funder
DE-AC05-00OR22725
Format
Citation
Journal Name: Applied Physics Letters; Journal Volume: 100; Journal Issue: 11
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This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.
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