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Comparison of analytic and numerical models with commercially available simulation tools for the prediction of semiconductor freeze-out and exhaustion

dc.contributor.advisorPieper, Ron J.
dc.contributor.advisorMichael, Sherif N.
dc.contributor.authorReeves, Derek E.
dc.contributor.departmentElectrical and Computer Engineering
dc.date.accessioned2012-03-14T17:42:17Z
dc.date.available2012-03-14T17:42:17Z
dc.date.issued2002-09
dc.description.abstractThis thesis reports on three procedures and the associated numerical results for obtaining semiconductor majority carrier concentrations when subjected to a temperature sweep. The capability of predicting the exhaustion regime boundaries of a semiconductor is critical in understanding and exploiting the full potential of the modern integrated circuit. An efficient and reliable method is needed to accomplish this task. Silvaco International's semiconductor simulation software was used to predict temperature dependent majority carrier concentration for a semiconductor cell. Comparisons with analytical and numerical MATLAB-based schemes were made. This was done for both Silicon and GaAs materials. Conditions of the simulations demonstrated effect known as Bandgap Narrowing.en_US
dc.description.distributionstatementApproved for public release; distribution is unlimited.
dc.description.serviceLieutenant, United States Navyen_US
dc.description.urihttp://archive.org/details/comparisonofnaly109454558
dc.format.extentxvii, 65 p. : col. ill. ;en_US
dc.identifier.urihttps://hdl.handle.net/10945/4558
dc.publisherMonterey, California. Naval Postgraduate Schoolen_US
dc.rightsThis publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.en_US
dc.subject.lcshSemiconductorsen_US
dc.subject.lcshIntegrated circuitsen_US
dc.titleComparison of analytic and numerical models with commercially available simulation tools for the prediction of semiconductor freeze-out and exhaustionen_US
dc.typeThesisen_US
dspace.entity.typePublication
etd.thesisdegree.disciplineElectrical Engineeringen_US
etd.thesisdegree.grantorNaval Postgraduate Schoolen_US
etd.thesisdegree.levelMastersen_US
etd.thesisdegree.nameM.S. in Electrical Engineeringen_US
etd.verifiednoen_US
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