The establishment of a radiation effects program at the NPGS linear accelerator facility.
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Authors
Nelson, William Jerome, Jr.
Subjects
Solid state radiation damage
Dosimetry by calorimetry
LINAC intensity profile
Radiation effects in transistors
Dosimetry by calorimetry
LINAC intensity profile
Radiation effects in transistors
Advisors
Dyer, John N.
Date of Issue
1967-06
Date
June 1967
Publisher
Monterey, California. U.S. Naval Postgraduate School
Language
en_US
Abstract
The establishment of a program to study the effects of radiation on solid state electronic devices is discussed. The design and testing of experimental equipment used in connection with this project, and the techniques developed for the exposure of devices to the electron beam of the NPGS LINAC, form the main topics of this paper. Also included are the results of a beam profile analysis done using calorimetric techniques, and some results concerning the behavior of transistors exposed to the LINAC electron beam.
Type
Thesis
Description
Series/Report No
Department
Department of Physics
Organization
Naval Postgraduate School
Identifiers
NPS Report Number
Sponsors
Funder
Format
Citation
Distribution Statement
Approved for public release; distribution is unlimited.
Rights
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.