Measured noise performance of a data clock circuit derived from the local M-sequence in direct-sequence spread spectrum systems

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Authors
Harshbarger, Stuart D.
Subjects
Direct-sequence spread spectrum
communications
data clock recovery
M-sequence
delay-lock loop
spread spectrum
binary sequence generation
Advisors
Myers, Glen
Date of Issue
1990-09
Date
1990-09
Publisher
Monterey, California: Naval Postgraduate School
Language
Abstract
An improved method for deriving the timing information required for data recovery in the receiver of direct-sequence spread spectrum systems was implemented in hardware. This method uses a priori knowledge of the spreading sequence and its relation to the transmitted data to determine the precise beginning and end of data bits in the received signal. Testing of the hardware built for this research is concerned primarily with the performance of the circuit designed to provide the timing required to implement an integrate and dump circuit as a means of data recovery. A conclusion of this research effort is that a method exists for deriving the timing information required for data recovery from the locally generated m-sequence in the receiver. This method appears to be superior to alternative methods since the reference timing is derived from the locally generated m-sequence and is therefore isolated from the effects of additive noise in the channel. In addition to this improvement in noise performance, the new method is independent of transitions in the data stream which permits design flexibility for voltage representation of bits.
Type
Thesis
Description
Series/Report No
Department
Electrical Engineering
Organization
Naval Postgraduate School (U.S.)
Identifiers
NPS Report Number
Sponsors
Funder
Format
vii, 58 p. ill.
Citation
Distribution Statement
Approved for public release; distribution is unlimited.
Rights
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.
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