Absolute potential measurements inside microwave digital IC's using a micromachined photoconductive sampling probe
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Authors
David, Gerhard
Yun, Tae-Yeoul
Crites, Matthew H.
Whitaker, John F.
Weatherford, Todd R.
Jobe, Kay
Meyer, Scott
Bustamante, Mario J.
Goyette, Bill
Thomas, Stephen III
Subjects
Integrated-circuit testing
Microwave measurements
Nondestructive testing
Photoconductive measurements
time-domain measurements
voltage measurements
Microwave measurements
Nondestructive testing
Photoconductive measurements
time-domain measurements
voltage measurements
Advisors
Date of Issue
1998-12
Date
Publisher
IEEE
Language
Abstract
A measurement system for internal node testing of integrated circuits using a micromachined photoconductive sampling probe is described and characterized. Special emphasis is placed upon the system performance, demonstrating how absolute voltage measurements are achieved in a dc-to-mm-wave bandwidth. The feasibility of the setup is illustrated using an InP heterojunction bipolar transistor frequency divider. Detailed waveforms at different circuit nodes and the corresponding propagation delays from within this circuit at operating frequencies up to 10 GHz are presented. The results demonstrate for the first time the use of photoconductive probes for calibration-free, absolute-voltage, dc-coupled potential measurements in high-frequency and high-speed integrated circuits.
Type
Article
Description
The article of record as published may be found at http://dx.doi.org/10.1109/22.739220
Series/Report No
Department
Electrical and Computer Engineering (ECE)
Organization
Naval Postgraduate School (U.S.)
Identifiers
NPS Report Number
Sponsors
This work was sponsored by the National Science Foundation through the Center for Ultrafast Optical Science by the AFOSR, Air Force Materiel Command, USAF and by the U.S. Navy
Funder
STC PHY 8920108, Grant DOD-G-F49620-95-1-0027, Contract N62271-97-M-1318
Format
Citation
IEEE Transactions on Microwave Theory and Techniques, V. 46, No. 12, pp. 2330-2337, December 1998
Distribution Statement
Rights
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.