Use of Principle Component Analysis for the identification and mapping of phases from energy-dispersive x-ray spectra
Loading...
Authors
Chisholm, Daniel J.
Subjects
Advisors
Fox, Alan J.
Date of Issue
1999-03
Date
March, 1999
Publisher
Monterey, California: Naval Postgraduate School
Language
en_US
Abstract
Multivariate statistical analysis methods such as Principal Component Analysis (PCA) are now finding applications in electron microscopy including the analysis of energy dispersive x-ray spectra (EDS). The aim in this thesis is to extend EDS beyond its conventional use in the measurement of elemental distributions to allow both the identification of chemical phases and the mapping of their distribution. In the present work, PCA was applied to the analysis of modeled spectra representing interfaces where diffusion and/or an interface reaction had occurred. A search routine was developed to find physically possible interface phases using the principal components found by PCA. From the modeled data, it was shown that an interface phase could, in principle, be found using PCA but that it is embedded in a cluster of physically possible spectra. The technique was then applied to experimental data obtained from an interface between chemically vapor deposited diamond (CVDD) and Cr2O3. The results followed the same pattern as was seen with the modeled data. Criteria for experimental EDS spectra other than those used to define a physically meaningful spectrum are discussed. These should help further limit the cluster of possible answers found allowing a correct determination of the real interface phase.
Type
Thesis
Description
Series/Report No
Department
Organization
Identifiers
NPS Report Number
Sponsors
Funder
Format
ix, 93 p.;28 cm.
Citation
Distribution Statement
Rights
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.