Half-life measurements of some neutron induced isomers

Abstract

Half-lives of thermal neutron activated isomers were determined by direct decay measurements with a scintillation counter. Scaler pulses following a single channel analyzer, together with precise timing pulses, were traced concurrently by a fast chart recorder. The gain stability of the detecting circuit was also monitored during the decay period. Decay counts were corrected for counting circuit dead-time and for pulse pile-up, and analyzed by a digital computer.