Terahertz metamaterial absorbers with an embedded resistive layer
dc.contributor.author | Kearney, Brian | |
dc.contributor.author | Alves, Fabio | |
dc.contributor.author | Grbovic, Dragoslav | |
dc.contributor.author | Karunasiri, Gamani | |
dc.contributor.department | Department of Physics | |
dc.date | 2013-08 | |
dc.date.accessioned | 2014-12-10T19:08:09Z | |
dc.date.available | 2014-12-10T19:08:09Z | |
dc.date.issued | 2013-08 | |
dc.description | Optical Materials Express, Volume 3, No. 8, pp. 1020-1025 (August 2013) | en_US |
dc.description | The article of record as published may be located at http://dx.doi.org/10.1364/OME.3.001020 | en_US |
dc.description.abstract | A conductive layer of Ti, with a sheet resistance of about 220 omega/sq, was placed in the dielectric spacer of an Al/SiOx/Al metamaterial terahertz absorber at various depths to probe the effect on the absorption of terahertz radiation. | en_US |
dc.description.funder | This work is supported, in part, through grants from the ONR and NRO. A portion of this research was conducted at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Office of Basic Energy Sciences, U.S. Department of Energy. | en_US |
dc.identifier.uri | https://hdl.handle.net/10945/44141 | |
dc.rights | This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States. | en_US |
dc.subject.author | Far infrared or terahertz | en_US |
dc.subject.author | Metamaterials | en_US |
dc.subject.author | Metallic | en_US |
dc.subject.author | opaque | en_US |
dc.subject.author | absorbing coatings | en_US |
dc.title | Terahertz metamaterial absorbers with an embedded resistive layer | en_US |
dspace.entity.type | Publication |
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