Concurrent estimation of time-to-failure and effective wear
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Authors
Loecher, Markus
Darken, Christian J.
Subjects
Advisors
Date of Issue
2003
Date
2003
Publisher
Language
Abstract
We propose a novel algorithm for the estimation of remaining lifetime of a generic device based on an intuitive and widely applicable model of failure due to accumulation of effective wear. The simultaneous quantification of an abstract, multivariate wear function is achieved by a new learning algorithm which we term "cumulative effect regression". We develop the theory of the algorithm and compare its performance to traditional anomaly and pattern detection tools. Experimental results from X-ray tubes strongly validate the algorithm and demonstrate the utility of Operating Characteristics (OC) curves as a powerful evaluation tool.
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Description
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Department
Computer Science (CS)
Organization
Naval Postgraduate School (U.S.)
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Format
Citation
Proceedings of the Maintenance and Reliability Conference (MARCON) 2003.
Distribution Statement
Rights
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.