A Reliability Study of RFID Technology in a Fading Channel
Authors
Beilke, Kyle M.
Subjects
RFID
Fading Channel
Nakagami
On-off keying
Code Shift Keying
Repetition Code
Fading Channel
Nakagami
On-off keying
Code Shift Keying
Repetition Code
Advisors
Ha, Tri T.
Su, Weilian
Date of Issue
2007-06
Date
Publisher
Monterey, CA; Naval Postgraduate School
Language
Abstract
RFID systems are an important component in the effort to increase the efficiencies of the logistics supply chain for the U.S. Department of Defense. While the U.S. DoD has mandated the use of RFID tags for its suppliers, the technology has not always kept up with the performance expectations. This study explores new modulation and coding techniques to possibly be used in the improvement of the read reliability of RFID systems. Bit and tag error probabilities are computed for various OOK and M-CSK modulation schemes in a varying Nakagamim fading channel, and the best performing schemes are identified for future employment.
Type
Thesis
Description
Series/Report No
Department
Electrical and Computer Engineering (ECE)
Organization
Identifiers
NPS Report Number
Sponsors
Funder
Format
Citation
Distribution Statement
Approved for public release; distribution is unlimited.