An investigation of the feasibility of a method for measuring thermal neutron absorption cross sections using the AGN-201 reactor
Jenkins, George J. Jr.
Richter, Herbert B.
Handle, Harry E.
MetadataShow full item record
The feasibility of measuring thermal neutron absorption cross sec- tion from the results of first-order reactor perturbation theory was investigated. Techniques were developed for this measurement utilizing the AGN-20l reactor of the U. S. Naval Postgraduate School. These techniques were evaluated by measurement of the thermal ab- sorption cross section of indium using gold-197 as a standard. The result obtained was 194.4± 2.3 barns. A comparison with the most recently published value of this cross sec- tion, 196±5 barns, demonstrates the feasibility of the method for obtaining improved precision for the measurement of the cross sections of selected materials.
RightsThis publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.
Showing items related by title, author, creator and subject.
Potter, Scott Alton (Monterey, California. Naval Postgraduate School, 1991-09);A six degree of freedom robot manipulator arm, a PUMA 560, is calibrated using full pose and partial pose methods in order to improve the accuracy of the manipulator arm. The theory applied to modeling of mechanisms is ...
The applicability of x-ray diffraction methods of stress measurement to naval structures with an investigation of the stress distribution in a stiffened plate Brown, Melvin Wilbur; Riley, William Steven (Cambridge, Massachusetts; Massachusetts Institute of Technology, 1949);The X-ray diffraction method of stress measurement is the only known means of determining absolute stress magnitudes without measurements in the unstressed condition. It is the objective of this thesis to investigate the ...
Storch, Mark G. (1986);This thesis investigates the computer aided measurement of fiber diameters by laser diffraction. The proposed system consists of a light sensitive Random Access Memory (RAM) chip which collects light intensity data from ...