Theses and Dissertations
Now showing items 1-1 of 1
The applicability of x-ray diffraction methods of stress measurement to naval structures with an investigation of the stress distribution in a stiffened plate
(Cambridge, Massachusetts; Massachusetts Institute of Technology, 1949)
The X-ray diffraction method of stress measurement is the only known means of determining absolute stress magnitudes without measurements in the unstressed condition. It is the objective of this thesis to investigate the ...