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dc.contributor.advisorPerkins, Jeff
dc.contributor.authorFulton, Thomas Benton
dc.dateDecember 1976
dc.date.accessioned2012-11-16T18:49:22Z
dc.date.available2012-11-16T18:49:22Z
dc.date.issued1976-12
dc.identifier.urihttp://hdl.handle.net/10945/17982
dc.description.abstractThe development of substructure in cartridge brass, subjected to cold rolling followed by warm annealing, is characterized as a function of annealing temperature and true strain. Substructure develops and becomes refined as annealing temperature is increased to the point of recrystallization. Dislocation cell structure is also refined as true strain is increased. The variation of hardness with annealing temperature correlates well with substructure development and refinement.en_US
dc.description.urihttp://archive.org/details/transmissionelec1094517982
dc.language.isoen_US
dc.publisherMonterey, California. Naval Postgraduate Schoolen_US
dc.rightsThis publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.en_US
dc.subject.lcshMechanical engineeringen_US
dc.titleTransmission electron microscopy study of subgrain strengthening of cartridge brass.en_US
dc.typeThesisen_US
dc.contributor.secondreaderMcNelley, Terry R.
dc.contributor.corporateNaval Postgraduate School (U.S.)
dc.contributor.departmentMechanical Engineering
dc.description.serviceLieutenant, United States Navyen_US
etd.thesisdegree.nameM.S. in Mechanical Engineeringen_US
etd.thesisdegree.levelMastersen_US
etd.thesisdegree.disciplineMechanical Engineeringen_US
etd.thesisdegree.grantorNaval Postgraduate Schoolen_US
dc.description.distributionstatementApproved for public release; distribution is unlimited.


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