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dc.contributor.advisorEsary, James D.
dc.contributor.authorCampbell, David Russell
dc.dateJune 1977
dc.date.accessioned2012-11-16T19:16:32Z
dc.date.available2012-11-16T19:16:32Z
dc.date.issued1977-06
dc.identifier.urihttp://hdl.handle.net/10945/18248
dc.description.abstractA mixture of failure rates can be present in an apparently homogeneous population of "devices" due to variability either in their manufacture or in the severity of their service environments. An initial mixing distribution is the probability distribution for different failure rates in such a population. This distribution may be updated to yield its related residual mixing distribution, which is the probability distribution for different failures rates in the population of survivors after a specified period of service or "burn-in". Residual mixing distributions resulting from arbitrary mixtures of constant failure rates are shown to be stochastically ordered (decreasingly) as the period of service or burn-in is increased, and to approach in the limit a distribution degenerate at the smallest failure rate "present" in the population. Properties of expected value ordering, stochastic ordering, failure rate ordering and likelihood ration ordering are investigated to show that, of these, only likelihood ratio ordering between the initial mixing distributions is sufficient to guarantee an ordering between the expected values of their respective residual mixing distributions over time.en_US
dc.description.urihttp://archive.org/details/propertiesofresi1094518248
dc.language.isoen_US
dc.rightsThis publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.en_US
dc.titleProperties of residual mixing distributions resulting from arbitrary mixtures of exponential life distributionsen_US
dc.typeThesisen_US
dc.contributor.corporateNaval Postgraduate School (U.S.)
dc.contributor.departmentDepartment of Operations Research
dc.subject.authorReliabilityen_US
dc.subject.authorReliability modelen_US
dc.subject.authorLife distributionsen_US
dc.subject.authorMixtureen_US
dc.subject.authorFailure rateen_US
dc.description.serviceLieutenant Commander, United States Navyen_US
etd.thesisdegree.namePh.D.en_US
etd.thesisdegree.levelDoctoralen_US
etd.thesisdegree.disciplineOperations Researchen_US
etd.thesisdegree.grantorNaval Postgraduate Schoolen_US
dc.description.distributionstatementApproved for public release; distribution is unlimited.


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