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dc.contributor.advisorAtwater, H.A.
dc.contributor.authorLee, Whan Su
dc.dateMarch 1988
dc.date.accessioned2012-11-27T18:17:02Z
dc.date.available2012-11-27T18:17:02Z
dc.date.issued1988-03
dc.identifier.urihttp://hdl.handle.net/10945/23154
dc.description.abstractIn the measurement of microwave circuits and devices, the data reduction of two-port measurement data obtained at the external terminals of microstrip-coupled devices, with correction for measurement error, can be obtained by de-embedment procedures with use of the HP 8409B vector network analyzer and a FORTRAN program.en_US
dc.description.urihttp://archive.org/details/thedeembedmentof1094523154
dc.language.isoen_US
dc.publisherMonterey, California. Naval Postgraduate Schoolen_US
dc.rightsCopyright is reserved by the copyright owner
dc.subject.lcshElectrical and computer engineeringen_US
dc.titleThe de-embedment of network-analyzer measurementsen_US
dc.typeThesisen_US
dc.contributor.secondreaderRoberts, G. Edward
dc.contributor.corporateNaval Postgraduate School (U.S.)
dc.contributor.departmentElectrical Engineering Science
dc.subject.authordevice de-embedmenten_US
dc.subject.authorscattering coefficientsen_US
dc.subject.authormicrostrip circuit measurementsen_US
dc.description.serviceMajor, Korean Air Forceen_US
etd.thesisdegree.nameM.S. in Electrical Engineeringen_US
etd.thesisdegree.levelMastersen_US
etd.thesisdegree.disciplineElectrical Engineeringen_US
etd.thesisdegree.grantorNaval Postgraduate Schoolen_US
dc.description.distributionstatementApproved for public release; distribution is unlimited.


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