The de-embedment of network-analyzer measurements
dc.contributor.advisor | Atwater, H.A. | |
dc.contributor.author | Lee, Whan Su | |
dc.date | March 1988 | |
dc.date.accessioned | 2012-11-27T18:17:02Z | |
dc.date.available | 2012-11-27T18:17:02Z | |
dc.date.issued | 1988-03 | |
dc.identifier.uri | http://hdl.handle.net/10945/23154 | |
dc.description.abstract | In the measurement of microwave circuits and devices, the data reduction of two-port measurement data obtained at the external terminals of microstrip-coupled devices, with correction for measurement error, can be obtained by de-embedment procedures with use of the HP 8409B vector network analyzer and a FORTRAN program. | en_US |
dc.description.uri | http://archive.org/details/thedeembedmentof1094523154 | |
dc.language.iso | en_US | |
dc.publisher | Monterey, California. Naval Postgraduate School | en_US |
dc.rights | Copyright is reserved by the copyright owner | |
dc.subject.lcsh | Electrical and computer engineering | en_US |
dc.title | The de-embedment of network-analyzer measurements | en_US |
dc.type | Thesis | en_US |
dc.contributor.secondreader | Roberts, G. Edward | |
dc.contributor.corporate | Naval Postgraduate School (U.S.) | |
dc.contributor.department | Electrical Engineering Science | |
dc.subject.author | device de-embedment | en_US |
dc.subject.author | scattering coefficients | en_US |
dc.subject.author | microstrip circuit measurements | en_US |
dc.description.service | Major, Korean Air Force | en_US |
etd.thesisdegree.name | M.S. in Electrical Engineering | en_US |
etd.thesisdegree.level | Masters | en_US |
etd.thesisdegree.discipline | Electrical Engineering | en_US |
etd.thesisdegree.grantor | Naval Postgraduate School | en_US |
dc.description.distributionstatement | Approved for public release; distribution is unlimited. |
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