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dc.contributor.advisorPanholzer, Rudolf
dc.contributor.authorCovelli, Javier M.
dc.dateJune 1992
dc.date.accessioned2012-11-29T16:14:35Z
dc.date.available2012-11-29T16:14:35Z
dc.date.issued1992-06
dc.identifier.urihttps://hdl.handle.net/10945/23676
dc.description.abstractFerroelectric bulk material devices have been in existence for over 20 years, Not until recently has there been fabrication techniques that consistently and feasibly produce thin film ferroelectric materials. The physical characteristics of thin-film ferroelectric capacitors and their subsequent integration into memory design may prove ferroelectric devices to be the ultimate in design for non-volatile, radiation hard computer memory. This analysis describes current memory systems, some of the recent achievements in ferroelectrics and the prospects for further application of ferroelectrics and the prospects for further application of ferroelectrics as an alternative for current memory design. It explores the different testing methodologies being implemented to test ferroelectric devices and suggests a flexible, fully programmable and autonomous new test system design to allow high speed aging and fatigue testing of on-chip ferroelectric capacitors for memory applications.en_US
dc.description.urihttp://archive.org/details/ferroelectricmem1094523676
dc.format.extent124 p.en_US
dc.language.isoen_US
dc.publisherMonterey, California. Naval Postgraduate Schoolen_US
dc.rightsThis publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.en_US
dc.titleFerroelectric memory devices and a proposed standardized test system designen_US
dc.typeThesisen_US
dc.contributor.secondreaderWight, Randy Lee
dc.contributor.corporateNaval Postgraduate School (U.S.)
dc.contributor.departmentElectrical and Computer Engineering
dc.subject.authorCurrent memoryen_US
dc.subject.authorFerroelectric capacitoren_US
dc.subject.authorStress measurement systemen_US
dc.subject.authorStandardized test systemen_US
dc.description.serviceLieutenant, United States Navyen_US
etd.thesisdegree.nameM.S. in Electrical Engineering (Space Systems Engineering)en_US
etd.thesisdegree.levelMastersen_US
etd.thesisdegree.disciplineElectrical Engineering (Space Systems Engineering)en_US
etd.thesisdegree.grantorNaval Postgraduate Schoolen_US
dc.description.distributionstatementApproved for public release; distribution is unlimited.


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