Instrumentation requirements for TREE Effects Data Collection at the Naval Postgraduate School Flash X-ray facility
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The collection of photon induced transient radiation effects on electronics (TREE) data in a pulsed X ray facility is hampered by severe electrical noise created by the pulse generation process. This thesis presents suitable techniques for data collection and evaluation when using the Pulserad Model 112A pulsed X ray generator installed in the Naval Postgraduate School Flash X ray facility. The TREE of wafer scale integrated devices is of primary concern to researchers at this time; therefore, instrumentation development was based primarily on the needs dictated by these devices. A brief description of the current status of wafer scale integrated devices is presented along with some basic TREE data collected on these devices.
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