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dc.contributor.advisorLee, Hung-Mou
dc.contributor.authorChang, Ting-Hsun
dc.date.accessioned2013-02-15T23:33:28Z
dc.date.available2013-02-15T23:33:28Z
dc.date.issued1991-03
dc.identifier.urihttp://hdl.handle.net/10945/28473
dc.description.abstractThe dependence of the predictions of the MLAYER program on the set of heights at which the refractive index value are sampled from a fixed reference profile are analyzed. A refractivity profile with a four-meter evaporation duct is adopted as a reference. Two variable piecewise linear profiles of four and five segments, respectively, are used to approximate the reference profile for MLAYER computations. The sensitivities of the waveguide mode location, the range attenuation rate, and the height-gain function to the changes of the piecewise linear profiles are investigated at the frequencies 3, 6, 10, and 15 GHz. The frequency dependence of the dominant mode for one profile is also studied to investigate the fact that the sensitivity to changes in sampling point location is lower at 6 GHz than at other frequencies. A general rule-of-thumb for the change in range attenuation rate due to a slight change in refractivity is suggested.en_US
dc.description.urihttp://archive.org/details/profilesamplingd1094528473
dc.format.extent90 p.en_US
dc.language.isoen_US
dc.publisherMonterey, California. Naval Postgraduate Schoolen_US
dc.titleProfile sampling dependence of the MLAYER program.en_US
dc.typeThesisen_US
dc.contributor.secondreaderRobertson, R. Clark
dc.contributor.corporateNaval Postgraduate School
dc.contributor.schoolNaval Postgraduate School
dc.subject.authorEvaporation duct propagationen_US
dc.description.serviceLieutenant, Taiwan Navyen_US
etd.thesisdegree.nameM.S.in Electrical Engineeringen_US
etd.thesisdegree.levelMastersen_US
etd.thesisdegree.grantorNaval Postgraduate Schoolen_US
dc.description.distributionstatementApproved for public release; distribution is unlimited.


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