Lattice parameters and Debye-Waller factors of gcs-TiAl alloys
Fox, Alan G.
Menon, Sarath Kumar
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Accurate lattice parameters of the tetragonal gamma-TiAl phase with the L1 structure have been determined by X-ray diffraction. The results showed that in binary alloys, the A parameter decreases while the C parameter increases with increasing A1 content. Integrated X-ray intensity were determined from annealed powder samples with powder size < 5 microns in order to estimate the temperature factors Difficulties associated with such evaluations due to the effects of extinction are also discussed. In addition, the 110, 111, and 200 structure factor amplitudes of gamma phase Ti-56at. % Al alloy were accurately determined from critical-voltage electron diffraction measurements. The Debye- Waller factors determined from X-ray experiments and the critical voltage experiments are compared and the results discussed