Design of a satellite-based microelectronic radiation testing experiment

dc.contributor.advisor	Fouts, Douglas J.
dc.contributor.author	Mooney, Christopher S.
dc.date	March, 1996
dc.date.accessioned	2013-04-30T22:06:14Z
dc.date.available	2013-04-30T22:06:14Z
dc.date.issued	1996-03
dc.identifier.uri	http://hdl.handle.net/10945/32188
dc.description.abstract	In this research, an electronic daughterboard to be used on the Microelectronics and Photonics Test Bed satellite was designed. A printed circuit board with radiation-hardened components was laid out to test various families of static RAM chips and an experimental Gallium Arsenide integrated circuit. Computer aided design tools produced by Cadence Design Systems were used to logically and physically design the experiment. Output from the Cadence software provides the information necessary to fabricate, assemble, and test the board.	en_US
dc.description.uri	http://archive.org/details/designofsatellit1094532188
dc.format.extent	1 v. (various pagings)	en_US
dc.language.iso	en_US
dc.publisher	Monterey, California. Naval Postgraduate School	en_US
dc.title	Design of a satellite-based microelectronic radiation testing experiment	en_US
dc.type	Thesis	en_US
dc.description.recognition	NA	en_US
dc.description.service	U.S. Navy (U.S.N.) author	en_US
etd.thesisdegree.name	M.S. in Electrical Engineering	en_US
etd.thesisdegree.level	Masters	en_US
etd.thesisdegree.discipline	Electrical Engineering	en_US
etd.thesisdegree.grantor	Naval Postgraduate School	en_US
dc.description.distributionstatement	Approved for public release; distribution is unlimited.

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