A characterization of t/s-diagnosability and sequential t-diagnosability in designs
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Authors
Lee, Joo-Kang
Butler, Jon T.
Subjects
Multiprocessing systems
reliable computing
systems diagnosis
t-diagnosable
t/s-diagnosable
testing
reliable computing
systems diagnosis
t-diagnosable
t/s-diagnosable
testing
Advisors
Date of Issue
1990-10
Date
October 1990
Publisher
Language
Abstract
A multiprocessing system is t/s diagnosable if all faulty processors can be identified to within s processors provided there are no more than t faculty processors. A characterization theorem of Karunanithi and Medman for t/s diagnosability in certain special cases of systems called designs is extended to the entire class of D designs. We show that for large....
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Article
Description
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. As such, it is in the public domain, and under the provisions of Title 17, United States Code, Section 105, may not be copyrighted.
IEEE Transactions on Computers, C-39, October 1990, pp. 1298-1304
IEEE Transactions on Computers, C-39, October 1990, pp. 1298-1304
Series/Report No
Department
Department of Electrical and Computer Engineering
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Citation
IEEE Transactions on Computers, C-39, October 1990, pp. 1298-1304