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dc.contributor.authorLee, Joo-Kang
dc.contributor.authorButler, Jon T.
dc.dateOctober 1990
dc.date.accessioned2013-09-03T22:30:05Z
dc.date.available2013-09-03T22:30:05Z
dc.date.issued1990-10
dc.identifier.citationIEEE Transactions on Computers, C-39, October 1990, pp. 1298-1304
dc.identifier.urihttp://hdl.handle.net/10945/35757
dc.descriptionThis publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. As such, it is in the public domain, and under the provisions of Title 17, United States Code, Section 105, may not be copyrighted.en_US
dc.descriptionIEEE Transactions on Computers, C-39, October 1990, pp. 1298-1304en_US
dc.description.abstractA multiprocessing system is t/s diagnosable if all faulty processors can be identified to within s processors provided there are no more than t faculty processors. A characterization theorem of Karunanithi and Medman for t/s diagnosability in certain special cases of systems called designs is extended to the entire class of D designs. We show that for large....en_US
dc.titleA characterization of t/s-diagnosability and sequential t-diagnosability in designsen_US
dc.typeArticleen_US
dc.contributor.departmentDepartment of Electrical and Computer Engineering
dc.subject.authorMultiprocessing systemsen_US
dc.subject.authorreliable computingen_US
dc.subject.authorsystems diagnosisen_US
dc.subject.authort-diagnosableen_US
dc.subject.authort/s-diagnosableen_US
dc.subject.authortestingen_US


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