Show simple item record

dc.contributor.authorLoecher, Markus
dc.contributor.authorDarken, Christian J.
dc.contributor.otherMOVES Institute
dc.date2003
dc.date.accessioned2013-09-25T22:58:02Z
dc.date.available2013-0po9-25T22:58:02Z
dc.date.issued2003
dc.identifier.citationProceedings of the Maintenance and Reliability Conference (MARCON) 2003.
dc.identifier.urihttp://hdl.handle.net/10945/36619
dc.description.abstractWe propose a novel algorithm for the estimation of remaining lifetime of a generic device based on an intuitive and widely applicable model of failure due to accumulation of effective wear. The simultaneous quantification of an abstract, multivariate wear function is achieved by a new learning algorithm which we term "cumulative effect regression". We develop the theory of the algorithm and compare its performance to traditional anomaly and pattern detection tools. Experimental results from X-ray tubes strongly validate the algorithm and demonstrate the utility of Operating Characteristics (OC) curves as a powerful evaluation tool.en_US
dc.rightsThis publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.en_US
dc.titleConcurrent estimation of time-to-failure and effective wearen_US
dc.contributor.corporateNaval Postgraduate School, Monterey, California
dc.contributor.departmentComputer Science (CS)


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record