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dc.contributor.authorGaver, D.P.
dc.contributor.authorJacobs, P.A.
dc.date1997
dc.date.accessioned2014-01-09T22:23:14Z
dc.date.available2014-01-09T22:23:14Z
dc.date.issued1997
dc.identifier.citationGaver, D.P. and Jacobs, P.A.Testing or Fault-finding for Reliability Growth: A Missile Destructive-test ExampleNaval Research Logistics, 44, 1997, pp. 623-637.
dc.identifier.urihttp://hdl.handle.net/10945/38206
dc.descriptionNaval Research Logistics, 44, 1997, pp. 623-637.en_US
dc.description.abstractA new piece of equipment has been purchased in a lot of size m. Some of the items can be used in destructive testing before the item is put into use. Testing uncovers faults which can be removed from the remaining pieces of equipment in the lot. If t m pieces of equipment are tested, then those that remain, mt m 0 t, have reduced fault incidence and are more reliable than initially, but mt may be too small to be useful, or than is desirable. In this paper models are studied to address this question: given the lot size m, how to optimize by choice of t the effectiveness of the pieces of equipment remaining after the test. The models used are simplistic and illustrative; they can be straightforwardly improveden_US
dc.rightsThis publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. As such, it is in the public domain, and under the provisions of Title 17, United States Code, Section 105, may not be copyrighted.en_US
dc.titleTesting or Fault-finding for Reliability Growth: A Missile Destructive-test Exampleen_US
dc.typeArticleen_US
dc.contributor.departmentOperations Research Department
dc.subject.authorreliability growth; Bayesian sequential analysis; Poisson process; destructive testing; how much testing is enough; operational testingen_US


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