A Bayesian reliability growth model
Pollock_A_Bayesian_1968.pdf (1.846Mb)Date
1968Metadata
Show full item recordAbstract
A model is presented for the change (growth) in reliability of a system during a test program. Parameters of the model are assumed to be random variables with appropriate prior density functions. Expressions are then derived that enable estimates (in the form of expectations) and precision statements) in the form of variances) to be made of: 1) projected system reliability at the time r after the start of the test program, and 2) system reliability after the observation of failure data. Numerical examples are presented, and extension to multimode failures is indicated.
Rights
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.Collections
Related items
Showing items related by title, author, creator and subject.
-
A reliability model for stored items requiring rework
(Monterey, California: Naval Postgraduate School, 1977);A mathematical model is developed for a system of stored items which are periodically reworked to improve their reliability. Expressions are developed for the expected reliability of the stored items and for the probability ... -
A method of approximating percentile points of highly skewed, two parameter beta distributions
(Monterey, California ; Naval Postgraduate School, 1971);An approximation formula is derived which provides a simplified and efficient method of calculating the O'th percentile point of a two parameter beta function when the two parameters are known. A specific application ... -
RELIABILITY GROWTH MODELING OF A COMPLEX SYSTEM
(Monterey, CA; Naval Postgraduate School, 12/12/19);Acquisition Category (ACAT) Level I programs are held to a mandated reliability growth requirement by the Milestone Decision Authority (MDA). Many times, ACAT Level I programs do not have the data required prior to going ...
