Publication:
A Bayesian reliability growth model

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Authors
Pollock, Stephen M.
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Date of Issue
1968-12
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Abstract
A model is presented for the change (growth) in reliability of a system during a test program. Parameters of the model are assumed to be random variables with appropriate prior density functions. Expressions are then derived that enable estimates (in the form of expectations) and precision statements) in the form of variances) to be made of: 1) projected system reliability at the time r after the start of the test program, and 2) system reliability after the observation of failure data. Numerical examples are presented, and extension to multimode failures is indicated.
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Article
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Operations Analysis
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Citation
IEEE Transactions on Reliability, Vol. R-17, No. 4, December 1968.
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This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.
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