The measurement of adhesion at film-substrate interfaces using a constant depth scratch test
Campbell, John C.
MetadataShow full item record
By using a constant depth scratch test, the interfaces shear strength of various thin film/substrate interfaces can be determined. The ability to quantitatively ascertain when thin film debonding occurs has become especially important in the fields of electronics, optics, and protective coatings. A new model and experimental apparatus have been developed in order to more accurately determine thin film interfacial shear strength. While other tests are either qualitative in nature or experimentally difficult, the constant depth scratch test, which utilizes a Vickers microindenter for scratching a film/substrate system to debond the interface, produces quantitative results that are based upon a simple model. Since the depth is maintained constant during scratching, the complexity of the analytical formulation is reduced considerably, enabling the calculation of a numerical value for shear stress. Tests were conducted on chromium films on glass, gold thin films on aluminum nitride, and diamond films on aluminum nitride in order to determine and compare various interfacial shear strengths.
RightsThis publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.
Showing items related by title, author, creator and subject.
Ortiz-Suslow, David G.; Kalogiros, John; Yamaguchi, Ryan; Wang, Qing (AGU, 2021-02-10);The constant flux layer assumption simplifies the problem of atmospheric surface layer (ASL) dynamics and is an underlying assumption of Monin‐Obukhov Similarity Theory, which is ubiquitously applied to model interfacial ...
Lundberg, D.D. (Monterey, California: U.S. Naval Postgraduate School, 1965);Heat transfer rates for laminar, convective heat transfer in the entrance region between parallel plates are investigated. The hydro-dynamic solution due to Bodia (2) was used in the solution of the energy equation in ...
Jenkins, Natalie; Petty, Clayton; Phillips, Jonathan (2016-02-20);A constant current charge/discharge protocol which showed fumed silica filled to the point of incipient wetness with aqueous NaCl solution to have dielectric constants >10 ⁸ over the full range of dielectric thicknesses ...