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dc.contributor.authorZhilyaev, A.P.
dc.contributor.authorKim, B.-K.
dc.contributor.authorSzpunar, J.A.
dc.contributor.authorBaró, M.D.
dc.contributor.authorLangdon, T.G.
dc.date.accessioned2014-08-29T18:33:23Z
dc.date.available2014-08-29T18:33:23Z
dc.date.issued2005
dc.identifier.citationMaterials Science and Engineering A, v. 391, 2005, pp. 377-389
dc.identifier.urihttp://hdl.handle.net/10945/43167
dc.description.abstractAdetailed investigationwas conducted to evaluate the microstructural characteristics in samples of pure nickel processed using three different procedures of severe plastic deformation (SPD): equal-channel angular pressing (ECAP), high-pressure torsion (HPT) and a combination of ECAP and HPT. Several different experimental techniques were employed to measure the grain size distributions, the textures, the distributions of the misorientation angles and the boundary surface energies in the as-processed materials. It is shown that a combination of ECAP and HPT leads both to a greater refinement in the microstructure and to a smaller fraction of boundaries having low angles of misorientation. The estimated boundary surface energies were higher than anticipated from data for coarse-grained materials and the difference is attributed to the non-equilibrium character of many of the interfaces after SPD processing.en_US
dc.publisherElsevieren_US
dc.rightsThis publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. As such, it is in the public domain, and under the provisions of Title 17, United States Code, Section 105, may not be copyrighted.en_US
dc.titleThe microstructural characteristics of ultrafine-grained nickelen_US
dc.typeArticleen_US
dc.contributor.corporateNaval Postgraduate School
dc.contributor.departmentDepartment of Mechanical and Astronautical Engineering
dc.subject.authorNickelen_US
dc.subject.authorEqual channel angular pressing (ECAP)en_US
dc.subject.authorHigh pressure torsion (HPT)en_US
dc.subject.authorDifferential scanning calorimetry (DSC)en_US
dc.subject.authorOrientation imaging microscopy (OIM)en_US


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