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dc.contributor.authorBolakis, C.
dc.contributor.authorGrbovic, D.
dc.contributor.authorLavrik, N.V.
dc.contributor.authorKarunasiri, G.
dc.date2010-07
dc.date.accessioned2014-12-10T19:07:54Z
dc.date.available2014-12-10T19:07:54Z
dc.date.issued2010-07
dc.identifier.urihttp://hdl.handle.net/10945/44108
dc.descriptionOptics Express, Volume 18, No. 14, pp. 14488-14495 (5 July 2010)en_US
dc.description.abstractA terahertz-absorbing thin-film stack, containing a dielectric Bragg reflector and a thin chromium metal film, was fabricated on a silicon substrate for applications in bi-material terahertz (THz) sensors. The Bragg reflector is to be used for optical readout of sensor deformation under THz illumination. The THz absorption characteristics of the thin-film composite were measured using Fourier transform infrared spectroscopy. The absorption of the structure was calculated both analytically and by finite element modeling and the two approaches agreed well. Finite element modeling provides a convenient way to extract the amount of power dissipation in each layer and is used to quantify the THz absorption in the multi-layer stack. The calculation and the model were verified by experimentally characterizing the multi-layer stack in the 3-5 THz range. The measured and simulated absorption characteristics show a reasonably good agreement. It was found that the composite film absorbed about 20% of the incident THz power. The model was used to optimize the thickness of the chromium film for achieving high THz absorption and found that about 50% absorption can be achieved when film thickness is around 9 nm.en_US
dc.rightsThis publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United Statesen_US
dc.titleDesign and characterization of terahertz-absorbing nano-laminates of dielectric and metal thin filmsen_US
dc.contributor.departmentDepartment of Physics
dc.subject.authorFar infrared or terahertzen_US
dc.subject.authorAbsorptionen_US
dc.subject.authorThin filmsen_US
dc.subject.authoroptical propertiesen_US
dc.description.funderThe work is supported in part by a grant from the AFOSR.en_US


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