Show simple item record

dc.contributor.authorKearney, Brian
dc.contributor.authorAlves, Fabio
dc.contributor.authorGrbovic, Dragoslav
dc.contributor.authorKarunasiri, Gamani
dc.date2013-08
dc.date.accessioned2014-12-10T19:08:09Z
dc.date.available2014-12-10T19:08:09Z
dc.date.issued2013-08
dc.identifier.urihttp://hdl.handle.net/10945/44141
dc.descriptionOptical Materials Express, Volume 3, No. 8, pp. 1020-1025 (August 2013)en_US
dc.descriptionThe article of record as published may be located at http://dx.doi.org/10.1364/OME.3.001020en_US
dc.description.abstractA conductive layer of Ti, with a sheet resistance of about 220 omega/sq, was placed in the dielectric spacer of an Al/SiOx/Al metamaterial terahertz absorber at various depths to probe the effect on the absorption of terahertz radiation.en_US
dc.rightsThis publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.en_US
dc.titleTerahertz metamaterial absorbers with an embedded resistive layeren_US
dc.contributor.departmentDepartment of Physics
dc.subject.authorFar infrared or terahertzen_US
dc.subject.authorMetamaterialsen_US
dc.subject.authorMetallicen_US
dc.subject.authoropaqueen_US
dc.subject.authorabsorbing coatingsen_US
dc.description.funderThis work is supported, in part, through grants from the ONR and NRO. A portion of this research was conducted at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Office of Basic Energy Sciences, U.S. Department of Energy.en_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record