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dc.contributor.authorFiorito, R. B.
dc.contributor.authorRule, D. W.
dc.contributor.authorMaruyama, X.K.
dc.contributor.authorDiNova, K. L.
dc.contributor.authorEverston, S. J.
dc.contributor.authorOsborne, M. J.
dc.contributor.authorSnyder, D.
dc.contributor.authorRietdyk, H.
dc.contributor.authorPiestrup, M. A.
dc.contributor.authorHo, A. H.
dc.date.accessioned2016-01-11T17:39:05Z
dc.date.available2016-01-11T17:39:05Z
dc.date.issued1993-08-02
dc.identifier.citationPhysical Review Letters, v. 71, no.5, August 2, 1993, 704-707en_US
dc.identifier.urihttp://hdl.handle.net/10945/47499
dc.description.abstractWe have observed up to 8 orders (n) in the spectra of parametric x-radiation (PXR), in the range 5-40 keV, produced by the interaction of a 90 MeV electron beam with mosaic graphite and single silicon crystals. The measured yields and intensity ratios I(n>/_2)/I(n=1), in graphite are not in agreement with the theory of PXR for mosaic crystals. In comparison, the ratios of intensities in silicon are close to the predictions of PXR theory for perfect crystals. The bandwidths of spectral lines measured in both silicon and graphite are in good agreement with theoretical predictions.en_US
dc.description.sponsorshipThis work was partially supported by a DOE SBIR Contract (No. DE-FG03-91ER81099), DNA and the Naval Postgraduate Schoolen_US
dc.format.extent4 p.en_US
dc.publisherAmerican Physical Societyen_US
dc.rightsThis publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.en_US
dc.titleObservation of higher order parametric X-ray spectra in mosaic graphite and single silicon crystalsen_US
dc.typeArticleen_US
dc.contributor.corporateNaval Postgraduate School (U.S.)en_US
dc.contributor.departmentPhysicsen_US
dc.description.distributionstatementApproved for public release; distribution is unlimited.


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