Publication:
Improved conceptual models methodology (ICoMM) for validation of non-observable systems

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Authors
Sok, Sang M.
Subjects
Modeling and simulation
conceptual models
systems engineering
systems architecture
non-observable systems
model validation
model development process
humanitarian assistance
disaster relief
Advisors
Paulo, Eugene
Date of Issue
2015-12
Date
Dec-15
Publisher
Monterey, California: Naval Postgraduate School
Language
Abstract
This dissertation expands the current view of development and validation of conceptual models (CoM) of non-observable systems (NOSs) by using systems engineering (SE) and systems architecture (SA) methods during the model development process (MDP). A MDP is used to ensure that the models are validated and represent the real world as accurately as possible. There are several varieties of MDPs presented in literature, but all share the importance of the CoM. The improved conceptual model methodology (ICoMM) is developed in support of improving the structure of the CoM for both face and traces validation. The utility of ICoMM is demonstrated through the building of functional, physical, and allocated architecture products that improve the structure of the CoM for traces validation. ICoMM also incorporates a value model to ensure subject matter experts’ (SMEs’) values are documented early in the MDP for face validation. A well-constructed CoM supports model exploration of NOS when operational validation is not feasible. This dissertation uses a humanitarian assistance/disaster relief (HA/DR) scenario to demonstrate ICoMM’s ability to ensure documentation of SMEs’ values and that the structure of the COM links SMEs’ values to the fundamental objective.
Type
Thesis
Description
Series/Report No
Department
Computer Science
Computer Science
Other Units
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NPS Report Number
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Distribution Statement
Approved for public release; distribution is unlimited.
Rights
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.
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