Imaging transport in nanowires using near-field detection of light
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Major progress in the crystal growth of nanowires and related structures places new demands on our abilities to characterize optical and electronic properties with both an ease and a resolution commensurate with the materials of interest. In particular, transport properties, such as minority carrier diffusion length, are important for a range of applications in light emission, sensing and solar energy conversion. In this paper, a technique to "image transport" in nanostructures by monitoring the motion of charge via the recombination emission of light is reviewed. Transport imaging combines the resolution of near-field optics with the charge generation control of a scanning electron microscope. The technique is related to, but significantly different from standard cathodoluminescence, since it maintains the spatial information of the emitted light. Light is collected in the near-field from a scanning fiber in an atomic force microscope/near-field scanning optical microscope system. It is possible to determine minority carrier or exciton diffusion lengths from a single optical image, without any electrical contact to the sample. New results are presented for minority carrier hole transport in ZnO nanowires and nonobelts.
The article of record as published may be found at http://dx.doi.org/10.1016/j.jcrysgro.2011.12.067
RightsThis publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.
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Cole, Richard Adam (Monterey, California. Naval Postgraduate School, 2010-12);A novel technique for imaging minority carrier diffusion in semiconductor nanostructures has been applied to the characterization of GaN and ZnO nanowires and nanobelts. Near field scanning optical microscopy (NSOM) is ...
Low, Chun Hong (Monterey California. Naval Postgraduate School, 2008-12);This thesis aims to investigate the optical properties of nano-devices using the technique of Near-Field Scanning Optical Microscopy (NSOM). A unique setup to perform Atomic Force Microscopy (AFM) and NSOM simultaneously ...
Winchell, Stephen D. (Monterey California. Naval Postgraduate School, 2006-06);Transport imaging is a SEM-based technique used to directly image the motion and recombination of charge in luminescent semiconductors, allowing for the extraction of transport parameters critical to device operation. In ...