Absolute potential measurements inside microwave digital IC's using a micromachined photoconductive sampling probe
Crites, Matthew H.
Whitaker, John F.
Weatherford, Todd R.
Bustamante, Mario J.
Thomas, Stephen III
Elliott, Kenneth R.
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A measurement system for internal node testing of integrated circuits using a micromachined photoconductive sampling probe is described and characterized. Special emphasis is placed upon the system performance, demonstrating how absolute voltage measurements are achieved in a dc-to-mm-wave bandwidth. The feasibility of the setup is illustrated using an InP heterojunction bipolar transistor frequency divider. Detailed waveforms at different circuit nodes and the corresponding propagation delays from within this circuit at operating frequencies up to 10 GHz are presented. The results demonstrate for the first time the use of photoconductive probes for calibration-free, absolute-voltage, dc-coupled potential measurements in high-frequency and high-speed integrated circuits.
The article of record as published may be found at http://dx.doi.org/10.1109/22.739220
RightsThis publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.